Silica detection in the flag leaf of wheat
DOI:
https://doi.org/10.5433/1679-0359.2012v33n6Supl1p2555Keywords:
Silicon, Triticum aestivum, Silica bodies, Scanning electron microscopy, Energy dispersive X-ray detector.Abstract
Silicon is considered a beneficial element to plants and may increase productivity and health of many crops. In plants, silicon accumulates mainly in the areas of maximum transpiration. This study aimed to investigate and compare silicon accumulation in flag leaves of different genotypes of wheat (Triticum aestivum) with the aid of scanning electron microscopy (SEM). The experiment was conducted in the field during the growing season 2010, eight wheat genotypes (BRS 208, RPI 85, BRS Pardela, BRS 210, RPI 130, CD 104, BRS 220 and WT 07106 lineage) were used. Three months after sowing, the samples were collected from the leaves to perform the silicon analysis by SEM and energy dispersive X-ray (EDS). All genotypes accumulated silica bodies in their leaf epidermis, the bodies had a rounded shape and were deposited differently from one genotype to another.
Downloads
Downloads
Published
How to Cite
Issue
Section
License
Semina: Ciências Agrárias adopts the CC-BY-NC license for its publications, the copyright being held by the author, in cases of republication we recommend that authors indicate first publication in this journal.
This license allows you to copy and redistribute the material in any medium or format, remix, transform and develop the material, as long as it is not for commercial purposes. And due credit must be given to the creator.
The opinions expressed by the authors of the articles are their sole responsibility.
The magazine reserves the right to make normative, orthographic and grammatical changes to the originals in order to maintain the cultured standard of the language and the credibility of the vehicle. However, it will respect the writing style of the authors. Changes, corrections or suggestions of a conceptual nature will be sent to the authors when necessary.
