Evaluation of Artifacts Produced by a Commercial Portable XRF Device and their Influence on the Analysis of Artworks

Evaluation of Artifacts Produced by a Commercial Portable XRF Device and their Influence on the Analysis of Artworks

Authors

DOI:

https://doi.org/10.5433/1679-0375.2025.v46.52708

Keywords:

portable X-ray fluorescence, instrumental characterization, archaeometry, spectral interferences

Abstract

This study investigates the origin and impact of spectral interferences associated with the Bruker Tracer III portable X-ray fluorescence (pXRF) spectrometer, used by the authors for elemental characterization of cultural heritage objects. Systematic analyses were conducted on reference materials and on the sculpture Head of Apollo from the Eva Klabin House Museum, Rio de Janeiro, facilitating the detection of instrumental peaks and improving the accuracy of qualitative analyses by minimizing instrument-derived interferences. Measurements were carried out under controlled conditions, both with and without the spectrometer’s radiation protection shield, using fixed operational parameters (40 kV, 35 μA and 60 s). The resulting spectra revealed peaks attributable to the instrument’s structural components. With the shield in place, elements such as Ca, Ti, Fe, Ni, Cu, Zn, and Pb were detected. In the absence of the shield, the peaks corresponding to Ca, Zn, and Pb were suppressed, although interferences from the remaining elements persisted.

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Author Biographies

Roberta Manon de Paula Sales Borges, Universidade Federal do Rio de Janeiro

PhD Student, Nuclear Engineering Program, UFRJ

Josiane Emerich Cavalcante, Universidade Federal do Rio de Janeiro

PhD Student, Program in Nuclear Engineering Program, UFRJ

Isis Verona Nascimento da Silva Franzi, Universidade Federal do Rio de Janeiro

Postdoctoral Researcher, Nuclear Engineering Program, UFRJ

Anderson Gomes de Paula, Universidade Federal do Rio de Janeiro

Postdoctoral Researcher, Nuclear Engineering Program, UFRJ

Evelyne Azevedo, Universidade do Estado do Rio de Janeiro

Prof. Dr., Arts Institute, State University of Rio de Janeiro

Ricardo Tadeu Lopes, Universidade Federal do Rio de Janeiro

Prof. Dr., Nuclear Engineering Program, UFRJ

Davi Ferreira de Oliveira, Universidade Federal do Rio de Janeiro

Prof. Dr., Nuclear Engineering Program, UFRJ

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Published

2025-07-31

How to Cite

Borges, R. M. de P. S., Cavalcante, J. E., Franzi, I. V. N. da S., Paula, A. G. de, Azevedo, E., Lopes, R. T., & Oliveira, D. F. de. (2025). Evaluation of Artifacts Produced by a Commercial Portable XRF Device and their Influence on the Analysis of Artworks. Semina: Ciências Exatas E Tecnológicas, 46, e52708. https://doi.org/10.5433/1679-0375.2025.v46.52708

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Section

Archaeometry (special section)

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