Mise em evidence D’une phase haut temperature dans lê systeme AgTITe-HgTe par difraction des rayons X en chamber de guinier
DOI:
https://doi.org/10.5433/1679-0375.1988v9n4p180Keywords:
Sistema AgTITe-HgTe, Fase alta temperatura.Abstract
A técnica de difração dos Raios X em câmara de Guinier é utilizada para estudar uma fase alta temperatura no sistema AgTITe-HgTe. As composições estudadas correspondem a 35, 50, 60 e 75 mol % em HgTe. Os difratogramas de cada amostra são apresentados e interpretados.
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