Silica detection in the flag leaf of wheat

Abstract

Silicon is considered a beneficial element to plants and may increase productivity and health of many crops. In plants, silicon accumulates mainly in the areas of maximum transpiration. This study aimed to investigate and compare silicon accumulation in flag leaves of different genotypes of wheat (Triticum aestivum) with the aid of scanning electron microscopy (SEM). The experiment was conducted in the field during the growing season 2010, eight wheat genotypes (BRS 208, RPI 85, BRS Pardela, BRS 210, RPI 130, CD 104, BRS 220 and WT 07106 lineage) were used. Three months after sowing, the samples were collected from the leaves to perform the silicon analysis by SEM and energy dispersive X-ray (EDS). All genotypes accumulated silica bodies in their leaf epidermis, the bodies had a rounded shape and were deposited differently from one genotype to another.